State-of- the-art approaches and solutions for the most demanding eNVM reliability challenges

At X-FAB, we put great emphasis on reliability: all our technology platforms must comply with the tough requirements of the automotive industry, and our embedded NVM are no exception to that.

The whole test process for embedded NVM IP, from Design for Test (DFT) to qualification and production screening must be designed upfront and carefully executed to fulfill the automotive quality requirements.

This presentation provides a first overview and some key examples about the challenges and specific approaches in ensuring best-in-class quality for every single NVM IP from X-FAB and how customers can benefit from it.