Predict your IC lifetime – Aging simulation for reliability of automotive devices

For an IC to function reliably in the long-term, you need to be able to predict how a circuit is going to perform after a significant time in operation. Complementing silicon qualification, aging simulations come in handy to estimate the behavior in advance, to fulfill ISO 26262 requirements with regards to functional safety but also to help debug issues identified after reliability stress.
In this webinar, you will learn about the basics of reliability physics and the typical mechanisms that are responsible for transistor aging. The main influencing factors for device degradation will be described and options for limiting them will be discussed.
The presentation will also cover the flow for performing aging simulations in the Cadence design environment, providing examples that illustrate aging impact on circuits and how aging simulation can be used to uncover it.
In addition, the possibilities and limitations of aging simulation are highlighted and suggestions of usage in the day-to-day work of circuit designers are provided along with an overview of current aging model availability in X-FAB’s 180 nm processes and an outlook on upcoming models.