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The ResourceXplorer enables you to access technical papers, webinars and articles related to analog/mixed-signal semiconductor technologies.
32 entries found
Abstract—Timing jitter is one of the most important characteristics of single-photon avalanche diodes (SPADs), especially in applications requiring accurate photon timing, such as timecorrelated single photon counting (TCSPC) or LiDAR. In this article, we describe a measurement setup for the characterization of the timing jitter of actively-quenched SPADs using the TCSPC technique with a picosecond laser. By also describing the typical mistakes and potential pitfalls with such a setup, we aim to give a useful guideline on reproducing a setup with well-defined measurement uncertainty, in order to achieve comparable results
between devices of different manufacturers, both academic and commercial. In addition, we describe the physical cause of the jitter in SPADs to aid designers in the design of a new generation of low-jitter SPAD devices.
Modern medical applications rely on semiconductor technologies to build reliable, accurate and innovative devices. If you want to find out what types of technologies X-FAB provides and for which type of devices they can be used, then watch this webinar session covering the following topics:
- Feature-rich CMOS technologies for personal medical devices
- BCD-on-SOI technology for medical ultrasound probes Optical sensors for medical imaging applications
- Silicon-based microfluidics for next-generation DNA sequencing, liquid biopsy or micro electrode arrays
- Single-Photon Avalanche Diodes (SPAD) for life-science applications
Presenter:
Christine Dufour, Program Manager Microfluidics
Alexander Zimmer, Principal Engineer Process Development
Dr. Ulrich Bretthauer, Marketing Manager Medical
X-FAB offers for his foundry portfolio Avalanche Photodiodes and Single Photon Avalanche Diode devices for various application
Especially in the field of fluorescence detection a close collaboration with IMMS exists
- Optimization with respect to the boundary conditions will be elaborated
- Adjustment of primitive devices for the system optimization
- Measurement capability for the timing jitter to enable the SPADs for different fluorophores
The integration of the devices will be supported with different possibilities
- XH018 optical evaluation chip
- Application evaluation kit
- SPAD design library
Be aware of the avalanche! Are you planning to integrate Avalanche Photodiodes (APD) or Single Photon Avalanche Diodes (SPAD) into your next IC design? If yes, you should watch this webinar replay. It will cover X-FAB's new APD/SPAD devices which come with a high photon detection probability of up to 18% for 850 nm wavelength and a low dark count rate. You will also learn about the integrated trigger diode which allows precise, real-time on-chip breakdown voltage detection without an external light source.
X-FAB has been providing photodiodes for more than 20 years. In this webinar we are proud to introduce our new core process optimized for photodiodes. This has been developed based on the feedback and requests from you - our customers. The technology comes with a number of photodiodes with outstanding performance for UV, ambient and near-infrared light. It also offers a range of other devices to enable fully integrated low-noise sensor designs.
Is it worth to talk about the device characterization of breakdown voltage?
It should be a simple number extracted from a IV -curve
CMOS foundry point of view but there is more behind them
Most important parameter to monitor the CMOS process
Shift in the breakdown voltage refer to issues in the process
Therefore, the methodology how to extract the breakdown voltage or even the IV-curve is essential
By choosing the “AVLA” process module in XH018
Enable the primitive device of avalanche photodiode and single photon avalanche diode
Necessity to monitor the process for both devices
Be aware of the avalanche! Learn how an avalanche photodiode (APD) works and see which devices X-FAB is offering for integration in its modular high voltage XH018 process.
Everybody is talking about single photon avalanche diodes (SPAD) for LiDAR and Time-of-Flight. Do you know what is required to upgrade from an APD to a SPAD? How can a good active quenching circuit be designed?
The webinar will introduce newly-developed APD and SPAD devices. You will be provided with information about the key parameters and learn how to integrate them into X-FAB’s process. X-FAB is offering a reference circuit for active quenching: discover how it works and how it could reduce your time for design.
Even though image sensors have become smaller and smaller in the past years for usage in mobile phone and digital cameras, there are still applications which require large image sensors. For example, X-Ray sensors are used in a wide range of medical, industrial and scientific applications. Such large pixel designs come with their specific design challenges especially if they have to been read out fast.
In this webinar X-FAB will showcase its 0.18 µm CMOS process (XS018) that is particularly well-suited for image sensors. The presentation will focus on large pixel designs. Several pixel layouts with different photodiode shapes have been tested and characterized. You will learn about the pros and cons with regards to speed, full well capacity and image lag for the these layout structures. Register now to find out how your pixel design can be optimized!