Webinar: IC Lifetime Calculation Made Easy – Introducing New RelXplorer Tool for Advanced Reliability Evaluation

EVENTS, June 14, 2018.

Tired of digging through endless process reliability specification documents? If you are looking for an easier way to calculate the lifetime of your ICs, this webinar is just right for you. 
We will introduce and demonstrate the capabilities of a new web application – the RelXplorer - which allows you to calculate lifetimes based on mission profiles. It covers all aspects from lifetime parameters and lifetime plots for MOS transistors, capacitors, dielectrics and interconnects. 
During this webinar you will learn about the functions and usage of the RelXplorer tool including a live demo session.
Join the webinar and find out how the RelXplorer can help you in achieving high reliability with your next IC design. 

Session for North & South America:

Wednesday, June 27, 2018
9:00 AM Pacific Time (PST)
12:00 PM Eastern Time (EST)

https://register.gotowebinar.com/register/1683801294223703042

Session for EMEA & Asia:

Thursday, June 28, 2018 
9:00 AM Central European Time (CEST)
4:00 PM Taiwan & China
5:00 PM Korea & Japan

https://register.gotowebinar.com/register/3932066178021322242

Please register with your corporate email address, after registering, you will receive a confirmation email containing information about joining the webinar. Space is limited.