X-TIC, the X-FAB Extended Technical information center, provides TLP test results showing the device's I-V characteristics. These test results can be used for ESD robustness estimations; correlation to HBM tests via discharge current (1A TLP current = 1kV HBM) is possible.
The following information is available at X-TIC:
- I-V characteristics for XH035, XL035, XC035, XC06 and XB06
- Short layout test structure description