X-FAB has designed new digital standard I/O libraries for 0.6 µm, 0.35 µm and 1.0 µm XD10 with ESD protection in mind. These libraries feature:

• Core and pad-limited digital standard I/O libraries
• Standard CMOS/TTL and Schmitt trigger inputs
• Gated pull-up/down, input hold, gated input
• 3-state outputs configurable as bi-state, open drain, open source
• Selectable drive strength and speed
• NAND tree for input parametric testing
• Simple analog I/O cells with and without series resistance
• High current TLP characteristics

 
PMOS rail clamps are used in a rail based ESD protection scheme to achieve high ESD robustness - min. 2 kV HBM ESD robustness (0.35 µm : 4 kV) - except for the 0.35 µm 5 V tolerant I/O cells with 1.5 kV HBM.

 
For further information please contact our hotline or your sales contact.