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X-FAB社の技術概要
FeatureXplorer
CMOS
BiCMOS
SOI
MEMS
MEMS Technologies
Customer Specific
Bulk Micromachining
Relative Pressure Sensors
Infrared Sensors
Surface Micromachining
CMOS MEMS
MEMS Facility
Design Support
CUSP
X-FAB platform technology XM-BT for infrared sensors.
Main process features:
Bulk silicon substrate
KOH etch for membrane with self-controlled etch stop
dielectric membrane
thermopiles as sensing elements (Seebeck effect)
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