11 entries, filtered by: First-Time-Right
Published: October 2009

In this paper we describe a novel tool for modeling the fabrication of MEMS and semiconductor devices, and show some examples of its application in the MEMS foundry business. The tool allows an accurate visualization of the step-by-step crreation of the final 3-D device geometry by using the 2-D layout and a description of the fabrication process.


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Published: March 2015

The design of a system containing integrated MEMS is still a task which requires deep knowledge of the MEMS process itself. Even with the availability of COT MEMS foundry processes, which support the design of MEMS according to process-specific design rules, the quality of results heavily depends on the skills and know-how of the involved designers. Reasons for this are the lack of a sufficient design automation, which would implement and verify parts of the expert knowledge, as well as the missing process abstraction, which would encapsulate the foundry-specific rules and parameters.


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Published: October 2013

This webinar session provides guidance through the EDA environment and describes the interaction among EDA tools, design methodology and PDKs to optimize the design process. It uses selected reference flows and best practice examples for critical components during the design phase.


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Published: September 2013

Showing first-time-right performance statistics from X-FAB's customer base, this first session outlines the challenges involved in achieving first-time-right analog designs. It talks about what impact the choice of process architecture makes, and discusses the pros and cons of different process architectures including SOI and BCD.


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Published: September 2013

This webinar session focuses on the importance of proper characterization data for successful analog design, and discusses how modeling and process characterization can make life easier for analog design engineers. It covers statistic modeling approaches, model quality assurance and process calibration.


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Published: October 2013

Is there magic that makes analog designs successful? How can designs achieve ESD (electro-static discharge) specifications? Do DFM methods make designs more robust? This webinar answers these questions and provides tips & tricks for analog design.


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Published: June 2014

First-time-right in analog design depends not only on proper consideration of process variations and design sensitivities but also on device reliability. Device aging can jeopardize performance and long-term product success and therefore should be taken into account as early as possible in the development. This webinar provides an overview of reliability physics and considerations and gives guidance on reliability conscious circuit design. Critical issues are discussed and future options for a reliability-aware design flow are indicated.


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Published: July 2014

To meet stringent quality requirements like 0 ppm, it's essential to build in robust quality and verify it during product design development. This webinar will review the impact of manufacturing variations and tolerances in semiconductor processes for zero-failure-quality targets. It will introduce countermeasures like six-sigma design practice, design centering, robustness indicator figures (RIF) and statistical reliability modeling. Quality verification and robustness validation concepts will be discussed, as well as selected quality assurance methods that can be applied in the manufacturing chain.    


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Published: June 2015

Reducing power consumption is unquestionably a top priority for analog/mixed-signal designs due to growing demand for battery-powered mobile applications. Responding to this need, X-FAB will offer a free webinar worldwide. This webinar explains how a unique combination of technology – a CPF/UPF (Common / Unified Power Format) design specification and X-FAB’s digital standard cell libraries – makes low-power designs more reliable and reusable.
Come find out how to prepare and apply low-power design specifications with CPF and UPF standards that can help shorten design cycles and reduce errors at each design stage. Also learn how X-FAB’s digital standard cells with multi-voltage/ power shut-off are implemented, and how they work together with a power aware tool chain to enhance low power design flows.
X-FAB’s reference kit supports fast and easy adoption of such power aware design flows by providing a realistic design and detailed documentation.


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Published: October 2015

Low-noise design is one of many challenging tasks for mixed-signal designers. Knowing how to reduce low-frequency noise is crucial for achieving an optimal signal-to-noise ratio. This webinar presents a short overview of the various noise types in MOSFETs and explains how they relate to typical devices in circuit designs. It also explores methods for achieving an accurate simulated noise model – another essential consideration for first-time-right low-noise designs. X-FAB strongly emphasizes the accuracy of the noise characterization and the models used to depict transistor behavior across different conditions. X-FAB also factors in how special low-noise devices used at critical circuit points can influence total noise performance. This webinar showcases application examples, provides valuable information about X-FAB's new low-noise CMOS devices and highlights the advantages of using these devices in your design.


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