188 entries
Published: June 2016

Today’s state-of-the-art SOI processes support very compact deep-trench-isolated high-voltage devices with a significantly smaller footprint than is possible with conventional isolation schemes, fulfilling the needs of the growing smart power IC market. While the low RDSon of these devices helps to create very area-efficient drivers, it introduces new challenges to the design of the metal interconnect and the distribution of high current densities.
This webinar will discuss how these challenges can be addressed using the latest design and verification tools. In addition, possibilities for layout automation using a pcell-based driver metallization will be shown. This highly automated layout flow enables designers to quickly evaluate several different layout variants and architectures avoiding error-prone manual layout.


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Published: February 2016

Elevated levels of integration combined with growing demands for greater cost effectiveness in electronic system implementations (from automotive right through to consumer applications) are increasing the need for IC electro-static discharge (ESD) robustness at the system level. System level ESD is a concern when any IC pin is directly connected to the “outer world”. These external pins have to be able to withstand high energy ESD pulses or else the system's long term operation could be put at risk.
In the latest of its series of informative webinars, X-FAB will discuss the implementation of ESD protection regarding system-level ESD and high energy ESD pulses. It will cover the difference between component and system-level ESD protection, provide insights on how to apply characterization methods such as the Human Metal Model (HMM) and Long-Duration Transmission Line Pulsing (LD-TLP). The presenter will also share best practices for safeguarding against system-level ESD and high energy ESD pulses


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Published: December 2015

The effect of recovery on Negative Bias Temperature Instability (NBTI) measurements had always been a challenge for reliability lifetime estimations. Currently various methods had been developed to suppress this characteristic but being able to completely remove it had been to no avail.


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Published: December 2015

The SpecXplorer is an online tool for viewing information from the four main specification documents, namely the Design Rule, Process & Device, PCM Acceptance and Process Reliability Specifications. It contains all of the information from these specification documents and has some very useful features so that you can quickly find what you are looking for. This tutorial shows you how to bookmark process family and module selections so that you do not have to repeat this each time you log-in.


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Published: December 2015

The SpecXplorer is an online tool for viewing information from the four main specification documents, namely the Design Rule, Process & Device, PCM Acceptance and Process Reliability Specifications. It contains all of the information from these specification documents and has some very useful features so that you can quickly find what you are looking for. This tutorial shows you how to make use of the search and filter functions in order to find MOS devices with a maximum drain-source operating voltage within a user specified range.


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Published: December 2015

The SpecXplorer is an online tool for viewing information from the four main specification documents, namely the Design Rule, Process & Device, PCM Acceptance and Process Reliability Specifications. It contains all of the information from these specification documents and has some very useful features so that you can quickly find what you are looking for. This tutorial shows you how to make use of the search and filter functions in order to find MOS devices with a threshold voltage within a user specified range.


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Published: December 2015

The SpecXplorer is an online tool for viewing information from the four main specification documents, namely the Design Rule, Process & Device, PCM Acceptance and Process Reliability Specifications. It contains all of the information from these specification documents and has some very useful features so that you can quickly find what you are looking for. This tutorial covers one of the key features of the SpecXplorer; comparing data from two or more process families. Since the data for multiple families is available within the same tool, it is possible to directly compare devices, parameters, rules, operating conditions and more, from multiple process families. This can be a very useful tool when selecting which is the right process family for your requirements.


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Published: December 2015

The SpecXplorer is an online tool for viewing information from the four main specification documents, namely the Design Rule, Process & Device, PCM Acceptance and Process Reliability Specifications. It contains all of the information from these specification documents and has some very useful features so that you can quickly find what you are looking for. This tutorial covers two of the more advanced features of the tool; “Select Modules” and “Select Modules by Devices”. The “Select Modules” feature is very useful, because it allows you to filter the data displayed to just those modules which you are using, or intend to use, in your design. The “Select Modules by Devices” feature allows you first to select the devices you are interested in and then shows you the module combinations which are valid for that selection of devices. Once you have selected a module combination from the available options, it will then filter the data to that selection of modules.


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Published: December 2015

The SpecXplorer is an online tool for viewing information from the four main specification documents, namely the Design Rule, Process & Device, PCM Acceptance and Process Reliability Specifications. It contains all of the information from these specification documents and has some very useful features so that you can quickly find what you’re looking for. This tutorial provides you with an introduction to the basic features of the tool. You will find out where to find it, how to select a process family and how to navigate so that you can find general information about the process family. You will then be shown how to locate detailed information about the process modules, design and mask layers, primitive devices, design rules, parameters and operating conditions. The table search and filter functions are also introduced.


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Published: November 2015

Image sensors are used more and more in daily life, not only in mobile phones, cars and computers, but also in areas such as medical, industrial and scientific applications. There are various challenges in pixel design, and especially so for large 4 transistor pixels which are necessary for high speed applications.
This webinar will give practical suggestions on the design of three- and four transistor pixels. It will provide some tips how to improve the speed of large pixels and generally on how to optimize designs that require large silicon areas. You will also receive information about X-FAB’s newly released 0.18µm process platform XS018 which is optimized for image sensor applications and comes with features such as a pinned photo diode for 4 transistor pixel designs and low dark current.


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